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1
Diagnosable-by-Design Model-Driven Development for IEC 6149..:
, In:
IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
,
Dowdeswell, Barry
;
Sinha, Roopak
;
MacDonell, Stephen G.
- p. 2183-2188 , 2020
Link:
https://doi.org/10.1109/IECON43393.2020.9254620
RT T1 <cTitle>IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Diagnosable-by-Design Model-Driven Development for IEC 61499 Industrial Cyber-Physical Systems</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9254620&Exemplar=1&LAN=DE A1 Dowdeswell, Barry A1 Sinha, Roopak A1 MacDonell, Stephen G. YR 2020 SN 2577-1647 K1 IEC Standards K1 Sensors K1 Temperature control K1 Temperature sensors K1 Actuators K1 HVAC K1 Model-driven development K1 Faults K1 Model-Driven Development K1 Industrial Cyber-Physical Systems K1 IEC 61499 Function Blocks SP 2183 OP 2188 LK http://dx.doi.org/https://doi.org/10.1109/IECON43393.2020.9254620 DO https://doi.org/10.1109/IECON43393.2020.9254620 SF ELIB - SuUB Bremen
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