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1 Ergebnisse
1
Triple Pulse Test (TPT) for Characterizing Power Loss in Ma..:
, In:
IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
,
Wang, Jun
;
Yuan, Xibo
;
Rasekh, Navid
- p. 4717-4724 , 2020
Link:
https://doi.org/10.1109/IECON43393.2020.9255039
RT T1 <cTitle>IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society</cTitle>: T1 <Title>Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9255039&Exemplar=1&LAN=DE A1 Wang, Jun A1 Yuan, Xibo A1 Rasekh, Navid YR 2020 SN 2577-1647 K1 Loss measurement K1 Core loss K1 Voltage measurement K1 Magnetic cores K1 Inductors K1 Testing K1 Windings K1 triple pulse test K1 double pulse test K1 core loss K1 BH loop measurement K1 copper loss SP 4717 OP 4724 LK http://dx.doi.org/https://doi.org/10.1109/IECON43393.2020.9255039 DO https://doi.org/10.1109/IECON43393.2020.9255039 SF ELIB - SuUB Bremen
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