I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Three-Photon Absorption Spectra and Bandgap Scaling in Dire..:
, In:
2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
,
Benis, Sepehr
;
Cirloganu, Claudiu M.
;
Nootz, Gero
... - p. 1-2 , 2020
Link:
https://doi.org/10.1364/CLEOPR.2020.C7B_2
RT T1 <cTitle>2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)</cTitle>: T1 <Title>Three-Photon Absorption Spectra and Bandgap Scaling in Direct-Gap Semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9255911&Exemplar=1&LAN=DE A1 Benis, Sepehr A1 Cirloganu, Claudiu M. A1 Nootz, Gero A1 Olszak, Peter D. A1 Padilha, Lazaro A. A1 Peceli, Davorin A1 Reichert, Matthew A1 Webster, Scott A1 Ensley, Trenton A1 Hu, Honghua A1 Woodall, Milton A1 Hagan, David J. A1 Van Stryland, Eric W. YR 2020 K1 Semiconductor device modeling K1 Zinc compounds K1 Semiconductor device measurement K1 Photonic band gap K1 II-VI semiconductor materials K1 Semiconductor lasers K1 Measurement by laser beam SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1364/CLEOPR.2020.C7B_2 DO https://doi.org/10.1364/CLEOPR.2020.C7B_2 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
