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Improving the ESD Robustness of an Ultra-high Voltage nLDMO..:

, In: 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Lin, Po-Lin ; Chen, Shen-Li ; Fan, Sheng-Kai... - p. 1-2 , 2020
Link: https://doi.org/10.1109/ICCE-Taiwan49838.2020.9258045