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1 Ergebnisse
1
FIB vs Cleaving Methods for Blanket Al Thickness Measuremen..:
, In:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Li, LiHong
;
Lee, Sharon
;
Khoo, Ley Hong
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/IPFA49335.2020.9260593
RT T1
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
FIB vs Cleaving Methods for Blanket Al Thickness Measurement on Wafers
UL https://suche.suub.uni-bremen.de/peid=ieee-9260593&Exemplar=1&LAN=DE A1 Li, LiHong A1 Lee, Sharon A1 Khoo, Ley Hong A1 Ang, Poh Chuan A1 Mo, Zhiqiang YR 2020 SN 1946-1550 K1 Thickness measurement K1 Phase change materials K1 Metals K1 Semiconductor device measurement K1 Tools K1 Milling K1 Surface charging K1 Blanket K1 Al thickness K1 Cleaving K1 FIB K1 Physical measurement SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA49335.2020.9260593 DO https://doi.org/10.1109/IPFA49335.2020.9260593 SF ELIB - SuUB Bremen
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