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1 Ergebnisse
1
Physical Modeling the Impact of Self-Heating on Hot-Carrier..:
, In:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Tyaginov, S.
;
Makarov, A.
;
Chasin, A.
... - p. 1-7 , 2020
Link:
https://doi.org/10.1109/IPFA49335.2020.9260648
RT T1
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9260648&Exemplar=1&LAN=DE A1 Tyaginov, S. A1 Makarov, A. A1 Chasin, A. A1 Bury, E. A1 Vandemaele, M. A1 Jech, M. A1 Grill, A. A1 De Keersgieter, A. A1 Linten, D. A1 Kaczer, B. YR 2020 SN 1946-1550 K1 Stress K1 Degradation K1 Hot carriers K1 Temperature distribution K1 Predictive models K1 Mathematical model K1 Lattices K1 Rot-carrier degradation K1 self-heating K1 transport K1 interface states K1 NWFET K1 modeling SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/IPFA49335.2020.9260648 DO https://doi.org/10.1109/IPFA49335.2020.9260648 SF ELIB - SuUB Bremen
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