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Physical Modeling the Impact of Self-Heating on Hot-Carrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tyaginov, S. ; Makarov, A. ; Chasin, A.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260648