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1 Ergebnisse
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Significance of pre- and post- EFI data processing to enhan..:
, In:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Yeoh, BL
;
Thor, MH
;
Goh, SH
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/IPFA49335.2020.9260742
RT T1
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Significance of pre- and post- EFI data processing to enhance dynamic electrical fault isolation success
UL https://suche.suub.uni-bremen.de/peid=ieee-9260742&Exemplar=1&LAN=DE A1 Yeoh, BL A1 Thor, MH A1 Goh, SH A1 Chan, YH A1 Song, Li A1 Soh, WF YR 2020 SN 1946-1550 K1 Inspection K1 Pins K1 Random access memory K1 Data processing K1 Circuit faults K1 Logic gates K1 Layout K1 Optical Beam Current (OBIC) K1 Current Variation Mapping K1 Digital Pixel Binning K1 Photon Emission Microscopy (PEM) K1 Yield-Oriented Faiilure Characterization K1 Multi-level net trace SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/IPFA49335.2020.9260742 DO https://doi.org/10.1109/IPFA49335.2020.9260742 SF ELIB - SuUB Bremen
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