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Speeding up large-scale failure analysis of semiconductor d..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Tucek, Marek ; Blando, Rodrigo ; Vana, Rostislav.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260751