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Short Term Reliability and Robustness of ultra-thin barrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Gao, Zhan. ; Meneghini, Matteo. ; Harrouche, Kathia... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260793