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Advanced Sample Preparation Techniques for Rescuing Damaged..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Pan, Yanlin ; Tan, Pik Kee ; Ting, Siong Luong. - p. 1-8 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260868