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Power Plane Defect Findings in Silicon with Lock- In Thermo..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Ng, C.Y. ; Zamri, M.S. Muhamad ; Ng, H.B.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260895