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On the Mechanism of High Forward Voltage of InGaN Light Emi..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Dawood, M. K. ; Yang, Y. ; Kon, C.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9260949