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1 Ergebnisse
1
Transient Voltage Suppressor (TVS) on Signal Integrity of M..:
, In:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Shen, Yu-Shu
;
Ker, Ming-Dou
;
Jiang, Hsin-Chin
- p. 1-4 , 2020
Link:
https://doi.org/10.1109/IPFA49335.2020.9261022
RT T1 <cTitle>2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)</cTitle>: T1 <Title>Transient Voltage Suppressor (TVS) on Signal Integrity of Microelectronics System with CMOS ICs under System-Level ESD Test</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9261022&Exemplar=1&LAN=DE A1 Shen, Yu-Shu A1 Ker, Ming-Dou A1 Jiang, Hsin-Chin YR 2020 SN 1946-1550 K1 Electrostatic discharges K1 TV K1 Pins K1 Voltage measurement K1 Microelectronics K1 Transient analysis K1 Integrated circuits K1 Transient voltage suppressor (TVS) K1 holding voltage K1 signal integrity K1 system-level ESD SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA49335.2020.9261022 DO https://doi.org/10.1109/IPFA49335.2020.9261022 SF ELIB - SuUB Bremen
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