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Combined methods for analyzing the nonvisual failures of a ..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Ni, Yiqiang ; Dai, Zongbei ; Chen, Xuanlong... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9261031