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A Systematic Approach to Localize NVM Inter-Poly Defects us..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Rivai, F. ; Ng, P.T. ; Quah, A.C.T.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/IPFA49335.2020.9261045