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1
CycleGANs for Semi-Supervised Defects Segmentation:
, In:
2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)
,
Ai, Jiangshan
;
Chen, Sihua
;
Deng, Peng
... - p. 611-616 , 2020
Link:
https://doi.org/10.1109/ICSMD50554.2020.9261743
RT T1 <cTitle>2020 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD)</cTitle>: T1 <Title>CycleGANs for Semi-Supervised Defects Segmentation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9261743&Exemplar=1&LAN=DE A1 Ai, Jiangshan A1 Chen, Sihua A1 Deng, Peng A1 Bai, Libing A1 Tian, Lulu A1 Zhang, Jie YR 2020 K1 Image segmentation K1 Training K1 Generators K1 Gallium nitride K1 Convolution K1 Welding K1 Generative adversarial networks K1 CycleGANs K1 Image Segmentation K1 Nondestructive Testing K1 Defect Inspection K1 Semi-supervised Learning SP 611 OP 616 LK http://dx.doi.org/https://doi.org/10.1109/ICSMD50554.2020.9261743 DO https://doi.org/10.1109/ICSMD50554.2020.9261743 SF ELIB - SuUB Bremen
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