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1
A Simple and Low-Cost Apparatus of Near-Infrared for Defect..:
, In:
2020 10th Electrical Power, Electronics, Communications, Controls and Informatics Seminar (EECCIS)
,
Nisa, Wahdiyatun
;
Mudeng, Vicky
;
Ernawati, Lusi
. - p. 147-150 , 2020
Link:
https://doi.org/10.1109/EECCIS49483.2020.9263438
RT T1 <cTitle>2020 10th Electrical Power, Electronics, Communications, Controls and Informatics Seminar (EECCIS)</cTitle>: T1 <Title>A Simple and Low-Cost Apparatus of Near-Infrared for Defect Examination in Tomato</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9263438&Exemplar=1&LAN=DE A1 Nisa, Wahdiyatun A1 Mudeng, Vicky A1 Ernawati, Lusi A1 Tarigan, Regina Ayunita YR 2020 K1 Optical variables measurement K1 Detectors K1 Optical imaging K1 Light sources K1 Ink K1 Diode lasers K1 Optical scattering K1 Optical measurement K1 near-infrared laser diode K1 power density K1 tomato defect examination SP 147 OP 150 LK http://dx.doi.org/https://doi.org/10.1109/EECCIS49483.2020.9263438 DO https://doi.org/10.1109/EECCIS49483.2020.9263438 SF ELIB - SuUB Bremen
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