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1 Ergebnisse
1
A Module-level Weathering and Durability Testing on Silver ..:
, In:
2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)
,
Lin, Chiao-Chi
;
You, Bo-Ju
;
Yang, Yu-Xuan
. - p. 9-13 , 2020
Link:
https://doi.org/10.1109/NEMS50311.2020.9265599
RT T1
2020 IEEE 15th International Conference on Nano/Micro Engineered and Molecular System (NEMS)
: T1
A Module-level Weathering and Durability Testing on Silver Nanowire Transparent Conductors
UL https://suche.suub.uni-bremen.de/peid=ieee-9265599&Exemplar=1&LAN=DE A1 Lin, Chiao-Chi A1 You, Bo-Ju A1 Yang, Yu-Xuan A1 Tseng, I-Hsiang YR 2020 SN 2474-3755 K1 Aging K1 Silver K1 Testing K1 Stress K1 Glass K1 Radiation effects K1 Degradation K1 aging K1 pseudo-module K1 silver nanowires (AgNWs) K1 stability K1 transparent conductors SP 9 OP 13 LK http://dx.doi.org/https://doi.org/10.1109/NEMS50311.2020.9265599 DO https://doi.org/10.1109/NEMS50311.2020.9265599 SF ELIB - SuUB Bremen
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