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1 Ergebnisse
1
Bayesian Optimized Long-Short Term Memory Recurrent Neural ..:
, In:
2020 International Symposium on Recent Advances in Electrical Engineering & Computer Sciences (RAEE & CS)
,
Haris, Muhammad
;
Hasan, Muhammad Noman
;
Jahanzeb Hussain Pirzada, Syed
. - p. 1-5 , 2020
Link:
https://doi.org/10.1109/RAEECS50817.2020.9265738
RT T1 <cTitle>2020 International Symposium on Recent Advances in Electrical Engineering & Computer Sciences (RAEE & CS)</cTitle>: T1 <Title>Bayesian Optimized Long-Short Term Memory Recurrent Neural Network for Prognostics of Thermally Aged Power Mosfets</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9265738&Exemplar=1&LAN=DE A1 Haris, Muhammad A1 Hasan, Muhammad Noman A1 Jahanzeb Hussain Pirzada, Syed A1 Qin, Shiyin YR 2020 K1 MOSFET K1 Bayes methods K1 Optimization K1 Semiconductor device modeling K1 Logic gates K1 Performance evaluation K1 Data models K1 LSTM RNN K1 Bayesian Optimization K1 Prognostics K1 MOSFETs SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/RAEECS50817.2020.9265738 DO https://doi.org/10.1109/RAEECS50817.2020.9265738 SF ELIB - SuUB Bremen
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