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1 Ergebnisse
1
Small-Signal Approach for Precise Evaluation of Gate Losses..:
, In:
2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)
,
Jafari, Armin
;
Nikoo, Mohammad Samizadeh
;
Perera, Nirmana
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/COMPEL49091.2020.9265751
RT T1 <cTitle>2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)</cTitle>: T1 <Title>Small-Signal Approach for Precise Evaluation of Gate Losses in Soft-Switched Wide-Band-Gap Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9265751&Exemplar=1&LAN=DE A1 Jafari, Armin A1 Nikoo, Mohammad Samizadeh A1 Perera, Nirmana A1 Karakaya, Furkan A1 Soleimanzadeh, Reza A1 Matioli, Elison YR 2020 K1 Logic gates K1 Transistors K1 Loss measurement K1 Gate drivers K1 Temperature measurement K1 Gallium nitride K1 Frequency measurement K1 GaN K1 SiC K1 gate charge K1 gate capacitance K1 gate loss K1 small-signal measurement K1 high-frequency circuits K1 soft switching K1 thermal measurements K1 variance in gate charge K1 hard gating SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/COMPEL49091.2020.9265751 DO https://doi.org/10.1109/COMPEL49091.2020.9265751 SF ELIB - SuUB Bremen
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