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1 Ergebnisse
1
Influence of Driver Integration on GaN Enhancement Mode Tra..:
, In:
2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)
,
Deckers, Martijn
;
Ravyts, Simon
;
Vecchia, Mauricio Dalla
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/COMPEL49091.2020.9265825
RT T1
2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL)
: T1
Influence of Driver Integration on GaN Enhancement Mode Transistor Performance
UL https://suche.suub.uni-bremen.de/peid=ieee-9265825&Exemplar=1&LAN=DE A1 Deckers, Martijn A1 Ravyts, Simon A1 Vecchia, Mauricio Dalla A1 Chatterjee, Urmimala A1 Li, Xiangdong A1 Decoutere, Stefaan A1 Driesen, Johan YR 2020 K1 Logic gates K1 Gallium nitride K1 Transistors K1 Resistance K1 Inductance K1 Switches K1 Threshold voltage K1 GaN HEMTs K1 integrated driver K1 half-bridge SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/COMPEL49091.2020.9265825 DO https://doi.org/10.1109/COMPEL49091.2020.9265825 SF ELIB - SuUB Bremen
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