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1 Ergebnisse
1
Power Cycle Reliability of Power Module with Different Sold..:
, In:
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Lu, Ken-Cheng
;
Guo, Siao-Wei
;
Chen, Hao-Chih
.. - p. 109-111 , 2020
Link:
https://doi.org/10.1109/IMPACT50485.2020.9268539
RT T1
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
: T1
Power Cycle Reliability of Power Module with Different Solder Systems
UL https://suche.suub.uni-bremen.de/peid=ieee-9268539&Exemplar=1&LAN=DE A1 Lu, Ken-Cheng A1 Guo, Siao-Wei A1 Chen, Hao-Chih A1 Chi, Wei-Hao A1 Liao, Hsueh-Kuo YR 2020 SN 2150-5942 K1 Multichip modules K1 Reliability K1 Insulated gate bipolar transistors K1 Wires K1 Lead K1 Aging K1 Stress SP 109 OP 111 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT50485.2020.9268539 DO https://doi.org/10.1109/IMPACT50485.2020.9268539 SF ELIB - SuUB Bremen
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