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1 Ergebnisse
1
Direct Current Tester (DCT) Applied to 2.5D IC Defect Analy..:
, In:
2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
,
Lin, Yi-Sheng
;
Hsiao, Yu-Hsiang
;
Tseng, Pei-Yu
... - p. 95-98 , 2020
Link:
https://doi.org/10.1109/IMPACT50485.2020.9268545
RT T1 <cTitle>2020 15th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)</cTitle>: T1 <Title>Direct Current Tester (DCT) Applied to 2.5D IC Defect Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9268545&Exemplar=1&LAN=DE A1 Lin, Yi-Sheng A1 Hsiao, Yu-Hsiang A1 Tseng, Pei-Yu A1 Chang, Yu-Jen A1 Liu, Cheng-Hsin A1 Lin, Yu-Ting YR 2020 SN 2150-5942 K1 X-ray imaging K1 Discrete cosine transforms K1 Inspection K1 Pins K1 Integrated circuits K1 Failure analysis K1 Scanning electron microscopy SP 95 OP 98 LK http://dx.doi.org/https://doi.org/10.1109/IMPACT50485.2020.9268545 DO https://doi.org/10.1109/IMPACT50485.2020.9268545 SF ELIB - SuUB Bremen
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