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Comparison of Bayesian and ANN Classifiers for Crack Detect..:

, In: 2020 4th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech),
Harini, V. ; Patil, Nayana N ; Rajashekar Swamy, H.M. - p. 1-6 , 2020
Link: https://doi.org/10.1109/IEMENTech51367.2020.9270084