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1 Ergebnisse
1
Three-layer Approach to Detect Anomalies in Industrial Envi..:
, In:
2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS)
,
Gutierrez-Rojas, Daniel
;
Ullah, Mehar
;
Christou, Ioannis T.
... - p. 250-256 , 2020
Link:
https://doi.org/10.1109/ICPS48405.2020.9274780
RT T1 <cTitle>2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS)</cTitle>: T1 <Title>Three-layer Approach to Detect Anomalies in Industrial Environments based on Machine Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9274780&Exemplar=1&LAN=DE A1 Gutierrez-Rojas, Daniel A1 Ullah, Mehar A1 Christou, Ioannis T. A1 Almeida, Gustavo A1 Nardelli, Pedro A1 Carrillo, Dick A1 Sant'Ana, Jean M. A1 Alves, Hirley A1 Dzaferagic, Merim A1 Chiumento, Alessandro A1 Kalalas, Charalampos YR 2020 K1 Sensors K1 Data integration K1 Data acquisition K1 Event detection K1 Data models K1 Communication networks K1 Benchmark testing K1 cyber-physical systems K1 fault detection K1 industrial IoT K1 Tennessee Eastman Process SP 250 OP 256 LK http://dx.doi.org/https://doi.org/10.1109/ICPS48405.2020.9274780 DO https://doi.org/10.1109/ICPS48405.2020.9274780 SF ELIB - SuUB Bremen
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