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Yarn-dyed Fabric Defect Detection using U-shaped De-noising..:

, In: 2020 IEEE 9th Data Driven Control and Learning Systems Conference (DDCLS),
Zhang, Hong-wei ; Tan, Quan-lu ; Lu, Shuai.. - p. 18-24 , 2020
Link: https://doi.org/10.1109/DDCLS49620.2020.9275154