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1 Ergebnisse
1
High-Frequency Performance of MoS2 Transistors at Cryogenic..:
, In:
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Gao, Qingguo
;
Zhang, Chongfu
;
Zhang, Zhenfeng
... - p. 1-3 , 2020
Link:
https://doi.org/10.1109/ICSICT49897.2020.9278023
RT T1
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
: T1
High-Frequency Performance of MoS2 Transistors at Cryogenic Temperatures
UL https://suche.suub.uni-bremen.de/peid=ieee-9278023&Exemplar=1&LAN=DE A1 Gao, Qingguo A1 Zhang, Chongfu A1 Zhang, Zhenfeng A1 Yi, Zichuan A1 Pan, Xinjian A1 Chi, Feng A1 Liu, Liming A1 Li, Xuefei A1 Wu, Yanqing YR 2020 K1 Transistors K1 Radio frequency K1 Cryogenics K1 Logic gates K1 MOSFET K1 Cutoff frequency K1 Transconductance SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT49897.2020.9278023 DO https://doi.org/10.1109/ICSICT49897.2020.9278023 SF ELIB - SuUB Bremen
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