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1 Ergebnisse
1
Analog/Mixed-Signal Circuit Testing Technologies in IoT Era:
, In:
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Kobayashi, Haruo
;
Kuwana, Anna
;
Wei, Jianglin
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICSICT49897.2020.9278194
RT T1 <cTitle>2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)</cTitle>: T1 <Title>Analog/Mixed-Signal Circuit Testing Technologies in IoT Era</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9278194&Exemplar=1&LAN=DE A1 Kobayashi, Haruo A1 Kuwana, Anna A1 Wei, Jianglin A1 Zhao, Yujie A1 Katayama, Shogo A1 Tri, Tran Minh A1 Hirai, Manato A1 Nakatani, Takayuki A1 Hatayama, Kazumi A1 Sato, Keno A1 Ishida, Takashi A1 Okamoto, Toshiyuki A1 Ichikawa, Tamotsu YR 2020 K1 Testing K1 Conferences K1 Timing K1 Linearity K1 Frequency measurement K1 Clocks K1 Operational amplifiers K1 Analog Circuit Test K1 Mixed-Signal Circuit Test K1 Design-For-Test K1 Built-In Self-Test K1 Built-Out Self-Test SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT49897.2020.9278194 DO https://doi.org/10.1109/ICSICT49897.2020.9278194 SF ELIB - SuUB Bremen
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