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1 Ergebnisse
1
Single Event Transient Pulses Fault Injection Model based o..:
, In:
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Xu, Chang-Qing
;
Liu, Yi
;
Weng, Xiao-Dong
.. - p. 1-3 , 2020
Link:
https://doi.org/10.1109/ICSICT49897.2020.9278217
RT T1
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
: T1
Single Event Transient Pulses Fault Injection Model based on LET for Circuit-Level Simulation
UL https://suche.suub.uni-bremen.de/peid=ieee-9278217&Exemplar=1&LAN=DE A1 Xu, Chang-Qing A1 Liu, Yi A1 Weng, Xiao-Dong A1 Li, Zhi-Bing A1 Yang, Yin-Tang YR 2020 K1 Integrated circuit modeling K1 Semiconductor process modeling K1 Semiconductor device modeling K1 Circuit faults K1 Single event transients K1 Random access memory K1 Numerical models SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT49897.2020.9278217 DO https://doi.org/10.1109/ICSICT49897.2020.9278217 SF ELIB - SuUB Bremen
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