I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

A Novel Process Variation Model for Test Cost Reduction in ..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Ren, Gui-Feng ; Shi, Zheng - p. 1-3 , 2020
Link: https://doi.org/10.1109/ICSICT49897.2020.9278230