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Materials and Defect Aspects of III-V and III-N Devices for..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Simoen, Eddy ; Hsu, Po-Chun Brent ; Yu, Hao... - p. 1-4 , 2020
Link: https://doi.org/10.1109/ICSICT49897.2020.9278262