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1 Ergebnisse
1
Reliability Challenges in Advanced Technology Node: from Tr..:
, In:
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
,
Liu, Changze
;
Ren, Pengpeng
;
Sun, Yongsheng
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICSICT49897.2020.9278355
RT T1
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
: T1
Reliability Challenges in Advanced Technology Node: from Transistor to Circuit (invited)
UL https://suche.suub.uni-bremen.de/peid=ieee-9278355&Exemplar=1&LAN=DE A1 Liu, Changze A1 Ren, Pengpeng A1 Sun, Yongsheng A1 Gao, Dan A1 Luo, Weichun A1 Chen, Zanfeng A1 Xia, Yu YR 2020 K1 Transistors K1 Thermal variables control K1 Random access memory K1 Negative bias temperature instability K1 Human computer interaction K1 Aging K1 Reliability SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT49897.2020.9278355 DO https://doi.org/10.1109/ICSICT49897.2020.9278355 SF ELIB - SuUB Bremen
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