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Correlations between Static Noise Margin and Single-Event-U..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zheng, Zhong-Shan ; Li, Zhen-Tao ; Li, Bo... - p. 1-3 , 2020
Link: https://doi.org/10.1109/ICSICT49897.2020.9278363