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Defect loss and its physical processes:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Zhang, Jian Fu ; Duan, Meng ; Mehedi, Mehzabeen... - p. 1-4 , 2020
Link: https://doi.org/10.1109/ICSICT49897.2020.9278393