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1 Ergebnisse
1
Influence of the Dielectric Film Height on the Charge Accum..:
, In:
2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)
,
Bai, Bin
;
Zhang, Yuanhang
;
Li, Changqing
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICHVE49031.2020.9279496
RT T1 <cTitle>2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)</cTitle>: T1 <Title>Influence of the Dielectric Film Height on the Charge Accumulation Characteristic in Uniform Ion Flow Field</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9279496&Exemplar=1&LAN=DE A1 Bai, Bin A1 Zhang, Yuanhang A1 Li, Changqing A1 Chen, Bo A1 Lu, Tiebing YR 2020 SN 2474-3852 K1 Electric fields K1 Dielectric films K1 Ions K1 Space charge K1 Dielectric measurement K1 Voltage measurement K1 Power systems K1 Charge accumulation K1 Dielectric film K1 Ion flow field K1 Ground-level electric field K1 Surface charge SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICHVE49031.2020.9279496 DO https://doi.org/10.1109/ICHVE49031.2020.9279496 SF ELIB - SuUB Bremen
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