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1 Ergebnisse
1
No-load Switch-in Transient Process Simulation of 500kV Int..:
, In:
2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)
,
Yang, Jiahui
;
Yuan, Yao
;
Wang, Shuaibing
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICHVE49031.2020.9279601
RT T1
2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE)
: T1
No-load Switch-in Transient Process Simulation of 500kV Interface Transformer Used in HVDC Flexible
UL https://suche.suub.uni-bremen.de/peid=ieee-9279601&Exemplar=1&LAN=DE A1 Yang, Jiahui A1 Yuan, Yao A1 Wang, Shuaibing A1 Bao, Lianwei A1 Wang, Ren YR 2020 SN 2474-3852 K1 Surges K1 Remanence K1 Power transformers K1 Circuit faults K1 Saturation magnetization K1 Magnetic flux K1 Magnetic shielding K1 interface transformer K1 no-load switch-in K1 inrush current K1 field-circuit coupled K1 FEM SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICHVE49031.2020.9279601 DO https://doi.org/10.1109/ICHVE49031.2020.9279601 SF ELIB - SuUB Bremen
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