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Reliability Analysis of Pre-insertion Resistors for EHV/UHV..:

, In: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE),
Niu, Bo ; Xu, Yuhua ; Ma, Feiyue... - p. 1-4 , 2020
Link: https://doi.org/10.1109/ICHVE49031.2020.9279602