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Suppression of Surface Charge Accumulation on Rough RTV Sil..:

, In: 2020 IEEE International Conference on High Voltage Engineering and Application (ICHVE),
Xu, Wenjie ; Li, Lian ; Huang, Zhengyong.. - p. 1-4 , 2020
Link: https://doi.org/10.1109/ICHVE49031.2020.9279896