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1 Ergebnisse
1
The Study of Defects Auto-Classification System in Semicond..:
, In:
2020 China Semiconductor Technology International Conference (CSTIC)
,
Wang, Pengfei
;
Li, Chen
;
Fu, Hao
... - p. 1-3 , 2020
Link:
https://doi.org/10.1109/CSTIC49141.2020.9282477
RT T1 <cTitle>2020 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>The Study of Defects Auto-Classification System in Semiconductor Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9282477&Exemplar=1&LAN=DE A1 Wang, Pengfei A1 Li, Chen A1 Fu, Hao A1 Wei, Zhengying A1 Chen, Xu A1 Wang, Zhounan A1 Chen, Shoumian A1 Zhao, Yuhang YR 2020 K1 Neural networks K1 Process control K1 Object detection K1 Manuals K1 Manufacturing K1 Classification algorithms K1 Medical diagnosis K1 defect classification K1 semiconductor manufacturing K1 convolutional neural network K1 image process algorithm SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC49141.2020.9282477 DO https://doi.org/10.1109/CSTIC49141.2020.9282477 SF ELIB - SuUB Bremen
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