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1 Ergebnisse
1
Towards Understanding Interaction Between Hot Carrier Agein..:
, In:
2020 China Semiconductor Technology International Conference (CSTIC)
,
Duan, M.
;
Zhang, J. F.
;
Ji, Z.
. - p. 1-3 , 2020
Link:
https://doi.org/10.1109/CSTIC49141.2020.9282605
RT T1 <cTitle>2020 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>Towards Understanding Interaction Between Hot Carrier Ageing and PBTI</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9282605&Exemplar=1&LAN=DE A1 Duan, M. A1 Zhang, J. F. A1 Ji, Z. A1 Zhang, W. YR 2020 K1 Degradation K1 Electron traps K1 Aging K1 Hot carriers SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC49141.2020.9282605 DO https://doi.org/10.1109/CSTIC49141.2020.9282605 SF ELIB - SuUB Bremen
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