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1 Ergebnisse
1
Measurement of Free-Carrier Absorption Cross-Sections for L..:
, In:
2020 International Conference Laser Optics (ICLO)
,
Bobretsova, Yu. K.
;
Veselov, D. A.
;
Rudova, N. A.
... - p. 1-1 , 2020
Link:
https://doi.org/10.1109/ICLO48556.2020.9285837
RT T1
2020 International Conference Laser Optics (ICLO)
: T1
Measurement of Free-Carrier Absorption Cross-Sections for Laser Diode Waveguide Materials
UL https://suche.suub.uni-bremen.de/peid=ieee-9285837&Exemplar=1&LAN=DE A1 Bobretsova, Yu. K. A1 Veselov, D. A. A1 Rudova, N. A. A1 Kapitonov, V. A. A1 Slipchenko, S. O. A1 Pikhtin, N. A. YR 2020 SN 2642-5580 K1 Temperature measurement K1 Semiconductor device measurement K1 Absorption K1 Waveguide lasers K1 Optical variables measurement K1 Loss measurement K1 Optical waveguides K1 semiconductor laser K1 absorption cross section K1 free carrier absorption K1 internal optical loss SP 1 OP 1 LK http://dx.doi.org/https://doi.org/10.1109/ICLO48556.2020.9285837 DO https://doi.org/10.1109/ICLO48556.2020.9285837 SF ELIB - SuUB Bremen
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