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Extreme Sparse X-ray Computed Laminography Via Convolutiona..:
, In:
2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI)
,
Pereira, Luis F. Alves
;
de Beenhouwer, Jan
;
Kastner, Johann
. - p. 612-616 , 2020
Link:
https://doi.org/10.1109/ICTAI50040.2020.00099
RT T1 <cTitle>2020 IEEE 32nd International Conference on Tools with Artificial Intelligence (ICTAI)</cTitle>: T1 <Title>Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9288349&Exemplar=1&LAN=DE A1 Pereira, Luis F. Alves A1 de Beenhouwer, Jan A1 Kastner, Johann A1 Sijbers, Jan YR 2020 SN 2375-0197 K1 Training K1 Solid modeling K1 Three-dimensional displays K1 Tools K1 Convolutional neural networks K1 X-ray imaging K1 Image reconstruction K1 Computed Laminography K1 Convolutional Neural Networks K1 Deep Learning K1 3D imaging SP 612 OP 616 LK http://dx.doi.org/https://doi.org/10.1109/ICTAI50040.2020.00099 DO https://doi.org/10.1109/ICTAI50040.2020.00099 SF ELIB - SuUB Bremen
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