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1
Numerical Models of the Electrochemical Migration: a short ..:
, In:
2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME)
,
Gharaibeh, A.
;
Illes, B.
;
Geczy, A.
. - p. 178-183 , 2020
Link:
https://doi.org/10.1109/SIITME50350.2020.9292229
RT T1 <cTitle>2020 IEEE 26th International Symposium for Design and Technology in Electronic Packaging (SIITME)</cTitle>: T1 <Title>Numerical Models of the Electrochemical Migration: a short review</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9292229&Exemplar=1&LAN=DE A1 Gharaibeh, A. A1 Illes, B. A1 Geczy, A. A1 Medgyes, B. YR 2020 SN 2642-7036 K1 Electronic countermeasures K1 Metals K1 Ions K1 Numerical models K1 Mathematical model K1 Electrolytes K1 Surface treatment K1 Electrochemical Migration K1 Time-to-Failure K1 Electronics Reliability K1 Dendrite Growth SP 178 OP 183 LK http://dx.doi.org/https://doi.org/10.1109/SIITME50350.2020.9292229 DO https://doi.org/10.1109/SIITME50350.2020.9292229 SF ELIB - SuUB Bremen
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