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A UVM Verification Platform for RISC-V SoC from Module to S..:

, In: 2020 IEEE 5th International Conference on Integrated Circuits and Microsystems (ICICM),
Wang, Jiayi ; Tan, Nianxiong ; Zhou, Yangfan.. - p. 242-246 , 2020
Link: https://doi.org/10.1109/ICICM50929.2020.9292250