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1 Ergebnisse
1
Characterization of Single Event Transient Effects in Stand..:
, In:
2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
,
Andjelkovic, Marko
;
Schrape, Oliver
;
Breitenreiter, Anselm
.. - p. 1-4 , 2020
Link:
https://doi.org/10.1109/ICECS49266.2020.9294817
RT T1 <cTitle>2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS)</cTitle>: T1 <Title>Characterization of Single Event Transient Effects in Standard Delay Cells</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9294817&Exemplar=1&LAN=DE A1 Andjelkovic, Marko A1 Schrape, Oliver A1 Breitenreiter, Anselm A1 Krstic, Milos A1 Kraemer, Rolf YR 2020 K1 Inverters K1 Logic gates K1 Standards K1 Delays K1 Transistors K1 Clocks K1 Temperature sensors K1 Standard delay cells (SDCs) K1 single event transients (SETs) K1 skewed sizing K1 SET mitigation SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICECS49266.2020.9294817 DO https://doi.org/10.1109/ICECS49266.2020.9294817 SF ELIB - SuUB Bremen
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