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1 Ergebnisse
1
A Performance Comparative at Low Temperatures of Two FET Te..:
, In:
2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
,
Lopez-L, Omar
;
Martinez, I.
;
Durini, D.
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/CCE50788.2020.9299192
RT T1
2020 17th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)
: T1
A Performance Comparative at Low Temperatures of Two FET Technologies: 65 nm and 14 nm
UL https://suche.suub.uni-bremen.de/peid=ieee-9299192&Exemplar=1&LAN=DE A1 Lopez-L, Omar A1 Martinez, I. A1 Durini, D. A1 Gutieirrez-D, E. A. A1 Ferrusca, D. A1 Velazquez, M. A1 De la Hidalga, F. J. A1 Gomez, V. YR 2020 SN 2642-3766 K1 MOSFET K1 Transconductance K1 Threshold voltage K1 Scattering K1 Cooling K1 Capacitance K1 Temperature K1 Cryogenic electronics K1 Cryo-CMOS K1 Electrical Characterization K1 65-nm K1 14-nm K1 finFET K1 ZTC SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CCE50788.2020.9299192 DO https://doi.org/10.1109/CCE50788.2020.9299192 SF ELIB - SuUB Bremen
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