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1 Ergebnisse
1
The Reliability and Prolonged time in Single-Junction GaAs ..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Huang, Yu-Ming
;
Huang, Chung-Ping
;
Huang, Sheng-Kai
... - p. 0881-0883 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9300450
RT T1 <cTitle>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</cTitle>: T1 <Title>The Reliability and Prolonged time in Single-Junction GaAs Solar Cell with Perovskite Quantum Dots</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9300450&Exemplar=1&LAN=DE A1 Huang, Yu-Ming A1 Huang, Chung-Ping A1 Huang, Sheng-Kai A1 Lee, Ting-Yu A1 Liu, Yin-Hsin A1 Chen, Teng-Ming A1 Kuo, Hao-Chung A1 Lin, Chien-Chung YR 2020 K1 Photovoltaic cells K1 Gallium arsenide K1 Quantum dots K1 Surface treatment K1 Temperature measurement K1 Reflectivity K1 Short-circuit currents K1 solar cells K1 GaAs SP 0881 OP 0883 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9300450 DO https://doi.org/10.1109/PVSC45281.2020.9300450 SF ELIB - SuUB Bremen
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