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1 Ergebnisse
1
Encapsulant Materials for High Reliable Bifacial Heterojunc..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Cattaneo, Gianluca
;
Levrat, Jacques
;
Li, Hengyu
... - p. 1056-1061 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9300702
RT T1 <cTitle>2020 47th IEEE Photovoltaic Specialists Conference (PVSC)</cTitle>: T1 <Title>Encapsulant Materials for High Reliable Bifacial Heterojunction Glass/Glass Photovoltaic Modules</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9300702&Exemplar=1&LAN=DE A1 Cattaneo, Gianluca A1 Levrat, Jacques A1 Li, Hengyu A1 Barth, Vincent A1 Sicot, Lionel A1 Richter, Andre A1 Colletti, Claudio A1 Rametta, Francesco A1 Izzi, Massimo A1 Despeisse, Matthieu A1 Ballif, Christophe YR 2020 K1 Aging K1 Temperature measurement K1 Ions K1 Stress K1 Degradation K1 IEC Standards K1 Curing K1 heterojunction K1 encapsulant K1 durability SP 1056 OP 1061 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9300702 DO https://doi.org/10.1109/PVSC45281.2020.9300702 SF ELIB - SuUB Bremen
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