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1 Ergebnisse
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Submicron Thickness Characterization of poly-Si thin films ..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Chen, Kejun
;
LaSalvia, Vincenzo
;
Nemeth, William
... - p. 2783-2785 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9300794
RT T1
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
: T1
Submicron Thickness Characterization of poly-Si thin films on Textured Surfaces by X-ray Diffraction for Minimizing Parasitic Absorption in Poly-Si/SiO2 Passivating Contact Cells
UL https://suche.suub.uni-bremen.de/peid=ieee-9300794&Exemplar=1&LAN=DE A1 Chen, Kejun A1 LaSalvia, Vincenzo A1 Nemeth, William A1 Theingi, San A1 Guthrey, Harvey A1 Hartenstein, Matthew B. A1 Kale, Abhijit S. A1 Page, Matthew A1 Bothwell, Alex A1 Sites, James A1 Stradins, Paul A1 Agarwal, Sumit A1 Young, David L. YR 2020 K1 X-ray scattering K1 Thickness measurement K1 Passivation K1 Etching K1 Renewable energy sources K1 Scanning electron microscopy K1 Absorption K1 silicon solar cell K1 passivating contacts K1 parasitic absorption K1 XRD K1 cross-sectional scanning electron microscopy K1 light beam induced current K1 Quokka simulation SP 2783 OP 2785 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9300794 DO https://doi.org/10.1109/PVSC45281.2020.9300794 SF ELIB - SuUB Bremen
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