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1 Ergebnisse
1
Minority carrier traps in Czochralski-grown p-type silicon ..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
De Guzman, Joyce Ann T.
;
Markevich, Vladimir P.
;
Hammersley, Simon
... - p. 1013-1018 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9300860
RT T1
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
: T1
Minority carrier traps in Czochralski-grown p-type silicon crystals doped with B, Al, Ga, or In impurity atoms
UL https://suche.suub.uni-bremen.de/peid=ieee-9300860&Exemplar=1&LAN=DE A1 De Guzman, Joyce Ann T. A1 Markevich, Vladimir P. A1 Hammersley, Simon A1 Hawkins, Ian D. A1 Crowe, Iain A1 Abrosimov, Nikolay V. A1 Falster, Robert A1 Binns, Jeff A1 Altermatt, Pietro A1 Halsall, Matthew P. A1 Peaker, Anthony R. YR 2020 K1 Silicon K1 Schottky diodes K1 Capacitance K1 Impurities K1 Atomic measurements K1 Temperature measurement K1 Boron K1 p-type silicon K1 minority carriers K1 trapping center K1 defects K1 deep-level transient spectroscopy SP 1013 OP 1018 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9300860 DO https://doi.org/10.1109/PVSC45281.2020.9300860 SF ELIB - SuUB Bremen
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